Characterization of densified and divided materials
Backed by the M3 “Mathematics, Matter, Materials” research federation at the University of Burgundy, this center provides technical support to the scientific community and industry by offering access to high-performance equipment (laser particle size analyzer, sorptometer, mercury porosimeter, and gas pycnometer) for analyzing materials in numerous fields: ceramics, cements, medicine, pharmaceuticals, and more.
Users (research federations, the ICB laboratory, the Faculty of Pharmacy in Dijon and external universities, private and industrial laboratories) conduct research in cutting-edge sectors such as health, nanomaterials, cements, gas separation, and materials for energy and the environment. The smooth operation of this service, which brings together techniques for characterizing both divided and densified matter, is essential for conducting their studies and advancing their research.
Available equipment:
– Saturn Digiziser II
– TriStar 3020 Sorptometer + BELSORP MINI
– AUTOPORE II Mercury Intrusion Porosimeter
X-ray diffraction
This service ensures the operation of the X-ray diffraction facilities. It provides technical support to the scientific community of the ICB laboratory, other university laboratories, the CEA (French Alternative Energies and Atomic Energy Commission), and also to industrial partners. Within this service, Sayens, the technology transfer center of the University of Burgundy, provides services to the private sector.
The topics addressed require phase identification, microstructural analyses with crystallite size determination and lattice parameter measurements, residual stress determinations, as well as Rietveld refinements and phase quantifications.
For these analyses, the diffraction center uses the Imad, EVA, DDwiev, FindIt, Paratt32, and Topas software. Texture measurements are interpreted using Labotex or Texeval.
Available equipment:
– Bruker D8 Advance
– Bruker D8 Discover
– Inel CPS 210 Cu
–Inel CPS 210 Co
Scanning electron microscopy
The Scanning Electron Microscopy (SEM) unit belongs to the Technical Analysis and Instrumentation Department of the Carnot Interdisciplinary Laboratory of Burgundy.
Affiliated with the M3 research federation “Mathematics – Matter – Materials” at the University of Burgundy and the ARCEN technical platform, this unit provides technical support to the scientific community and industry by making high-performance equipment available to them. The two field-effect scanning electron microscopes (SEMs), combined with chemical and crystallographic analysis systems, enable advanced research in chemistry, physics, archaeology, medicine, pharmacy, and many other fields.
Available equipment:
– JEOL JSM 7600F SEM
– Hitachi SU8230 SEM
Transmission electron microscopy
The primary mission of the MET service is the management and maintenance of the transmission electron microscopes at the ICB laboratory and the FR, as well as the associated analytical equipment (X-ray spectroscopy, EDX, and electron energy loss spectroscopy, EELS) and sample preparation instruments. This mission also extends to providing support for fundamental and applied research activities.
The MET service therefore makes its technical resources and expertise available to the teams at the ICB laboratory, as well as to the entire scientific community at other public and private research centers and to Sayens, for conducting characterizations and research. This support is provided either by the service’s own staff performing the experiments or by providing assistance after prior training.
Available equipment:
– MET JEOL JEM 2100F
– MET JEOL JEM 2100
Surface analysis
Backed by the M3 research federation “Mathematics, Matter, Materials” at the University of Burgundy, this center provides technical support to the scientific community and industry by offering access to high-performance equipment.
The available analytical techniques (XPS, AES, SIMS) meet all needs in the field of surface analysis (metallurgy, corrosion, adsorbents, films with optical or electronic properties, for example).
Available equipment:
– XPS-Auger PHI 5000
– VersaProbe + furnace
– HaXPES PHI Quantes
– SIMS PHI nano TOF II
– Bruker DektakXT Profilometer
